Nanometer Scale Scanning Electrochemical Microscopy Instrumentation.

S 1 Nanometer Scale Scanning Electrochemical Microscopy Instrumentation

Electrochemical Size Measurement and Characterization of Electrodeposited Platinum Nanoparticles at Nanometer Resolution with Scanning Electrochemical Microscopy.

The properties of nanoparticles (NPs) are determined by their size and geometric structures. A reliable determination of NP dimension is critical for understanding their physical and chemical properties, but sizing ultrasmall particles on the order of nanometer (nm) scale in the solution is still challenging. Here, we report the size measurement of PtNP at nanometer resolution by in situ scanni...

Origins of nanoscale damage to glass-sealed platinum electrodes with submicrometer and nanometer size.

Glass-sealed Pt electrodes with submicrometer and nanometer size have been successfully developed and applied for nanoscale electrochemical measurements such as scanning electrochemical microscopy (SECM). These small electrodes, however, are difficult to work with because they often lose a current response or give a low SECM feedback in current-distance curves. Here we report that these problem...

Stabilizing nanometer scale tip-to-substrate gaps in scanning electrochemical microscopy using an isothermal chamber for thermal drift suppression.

The control of a nanometer-wide gap between tip and substrate is critical for nanoscale applications of scanning electrochemical microscopy (SECM). Here, we demonstrate that the stability of the nanogap in ambient conditions is significantly compromised by the thermal expansion and contraction of components of an SECM stage upon a temperature change and can be dramatically improved by suppressi...

Nanometer-Scale Patterning on PMMA Resist by Force Microscopy Lithography

Nanoscale science and technology has today mainly focused on the fabrication of nano devices. In this paper, we study the use of lithography process to build the desired nanostructures directly. Nanolithography on polymethylmethacrylate (PMMA) surface is carried out by using Atomic Force Microscope (AFM) equipped with silicon tip, in contact mode. The analysis of the results shows that the ...